Khairurrijal K, Noor FA, Abdullah M, Sukirno S. Simulation of Electron Transmittance and Tunneling Current in a Metal-Oxide- Semiconductor Capacitor with a High-K Dielectric Stack of HfO2 and SiO2 Using Exponential- and Airy-Wavefunction Approaches and a Transfer Matrix Method. ijp [Internet]. 3Nov.2016 [cited 4Dec.2024];20(2):27-2. Available from: https://ijphysics.fi.itb.ac.id/index.php/ijp/article/view/192