Noor, Fatimah A., and Khairurrijal Khairurrijal. “Modeling of Temperature Dependence of Current in Metal-Oxide-SemiconductorCapacitors After Quasi Breakdown”. Indonesian Journal of Physics 14, no. 3 (November 3, 2016): 78-81. Accessed November 23, 2024. https://ijphysics.fi.itb.ac.id/index.php/ijp/article/view/83.