K. Khairurrijal, F. A. Noor, M. Abdullah, and S. Sukirno, “Simulation of Electron Transmittance and Tunneling Current in a Metal-Oxide- Semiconductor Capacitor with a High-K Dielectric Stack of HfO2 and SiO2 Using Exponential- and Airy-Wavefunction Approaches and a Transfer Matrix Method”, ijp, vol. 20, no. 2, pp. 27-32, Nov. 2016.