Noor, F. A. and Khairurrijal, K. (2016) “Modeling of Temperature Dependence of Current in Metal-Oxide-SemiconductorCapacitors after Quasi Breakdown”, Indonesian Journal of Physics, 14(3), pp. 78-81. Available at: https://ijphysics.fi.itb.ac.id/index.php/ijp/article/view/83 (Accessed: 23November2024).